Abstract
Each procedure of microscopic investigation, depending on its purpose, has advantages and drawbacks. The inherent limitations of each method may be circumvented or at least minimized if a correlative application of different microscopic techniques is performed.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
Hayat MA, Correlative microscopy in Biology, Academic Press, London (1987).
Wetzel B Albrecht RM, 7th Pfefferkorn Conference, Scanning Microscopy Suppl.3, 7–14 (1989).
Plattner H, Zingsheim HP, Elektronenmikroscopische Methodik in der Zell-und Molekularbiologie, Gustav Fischer Verlag, Stuttgart (1987).
Binnig G, Roher H, Helv. Phys. Acta 55 726 (1982).
Binnig G, Quate CF and Gerber Ch, Phys Rev 56 930 (1986).
Gomez-Rodriguez JM, Vazquez L and Baro AM, Surface and Interface Anal. 16 97–104 (1990).
Asenjo A, Baro AM, Proceedings European Conference on Electron Microscopy, Dublin (1996).
Sarid D, Scanning Force Microscopy, Oxford University Press, New York (1991).
Grutter P, MSA Bulletin 24, 416 (1994).
Babcock K, Photonic Spectra 28, 148 (1994).
Prudenziati M and Dell’Acqua R: Thick film resistors in Thick film Prudenziati Ed., Elsevier, Amsterdam, 85 (1994).
Tamborin M, Piccinini S, Prudenziati M, Morten B: Sensors and Actuators A–58 (1997).
Brunauer S, Emmet P H and Teller E: Absorption of gases in multimolecular layers, J.Am.Chem.Soc. 60, 309–319 (1938).
Cullity B D, in Introduction to Magnetic Materials, Addison-Wesley Publ.Co, Reading (1972).
Gangopadhyay S, Hadjipanayis G C, Dale B, Sorensen C M and Klabunde K J, Nanostruct. Materials, Vol. 1, 77–81 (1992).
Bucher J P and Bloomfield L A, Int.J.Mod.Phys <http://lnU.Mod.Phys>., 7, 1079 (1993).
Hehn M, Ounadjela K, Bucher J P, Rousseaux F, Decanini D, Bartenlian B and Chappert C, Science, 272, 1782–1785 (1996).
Murdock E S, Natarajan B R and Walmsley R G, IEEE Trans. Magn. MAG-5, 2700 (1990).
Howard J K, J. Vac. Sci. Technol, A4, 1 (1986).
Babcock K, Elings VB, Shi J, Awschalom DD, Dugas M: Appl. Phys. Lett., 69(5), 705 (1996).
Babcock K, Dugas M, Manalis S and Elings V, Materials Research Society, Symposium Proceedings, Vol. 355, (1995).
Pergolini S and Valdrè G, Nanostruct. Materials, 9, 627 (1997).
Jakubovics J P, in Electron Microscopy in Materials Science, U. Valdrè E. Ruedl Eds, Vol. 4, 1303–1403, Commission European Communities, Luxembourg (1975).
Wade R H, in Electron Microscopy in Material Science, U. Valdrè ed., Academic Press, London (1971).
Wohlleben D, in Electron Microscopy in Material Science, U. Valdrè ed., Academic Press, London (1971).
Hoffmann H, J.Appl.Phys. 6, 1790 (1964).
Fuller H W and Hale M E, J.Appl.Phys. 2, 238 (1959).
Zweck J and Bormans B J H, Philips Electron Optics Bulletin 132, 1 (1992).
Chapman J N, Ferner R P, Heyderman L J, Mc Vitie S, Nicholson W A P and Bormans B, Inst. Phys. Conf. Ser. No 138: Section 1 (IOP Publ. Bristol), pp 1–8 (1993).
Lohndorf M, Wadas A, van den Berg H A M and Wiesendanger R, Appl. Phys. Lett. 68(25), 3635 (1996)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1999 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Valdre’, G. (1999). Correlative Microscopy and Probing in Materials Science. In: Rickerby, D.G., Valdrè, G., Valdrè, U. (eds) Impact of Electron and Scanning Probe Microscopy on Materials Research. NATO Science Series, vol 364. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4451-3_22
Download citation
DOI: https://doi.org/10.1007/978-94-011-4451-3_22
Publisher Name: Springer, Dordrecht
Print ISBN: 978-0-7923-5940-1
Online ISBN: 978-94-011-4451-3
eBook Packages: Springer Book Archive