Abstract
During the last few years a great effort has been concentrated on the development and the characterization of new and technologically important nonlinear optical materials. These materials attain much interest because of their potential applications as photonic devices, i.e. as optical limiters, optical switches and optical deflectors. The species known as fullerenes, their derivatives and their different nanostructures (nanoparticles, nanoclusters, etc.) are important candidates for such applications. In this work, the optical limiting action and the nonlinear refraction of fullerenes, fullerene based derivatives and silicon nanoclusters are investigated using the so-called z-scan technique. Their resonant electronic response was investigated under sub-picosecond visible laser excitation.
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Couris, S., Konstantaki, M., Koudoumas, E. (2000). Characterization of Nonlinear Optical Materials for Photonic Applications. In: Marom, E., Vainos, N.A., Friesem, A.A., Goodman, J.W., Rosenfeld, E. (eds) Unconventional Optical Elements for Information Storage, Processing and Communications. NATO Science Series, vol 75. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4096-6_16
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DOI: https://doi.org/10.1007/978-94-011-4096-6_16
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