Abstract
The residual stress determination of nanostructured films and coatings is reviewed. A method of measuring the depth dependence of the stress profile using energy dispersive x-ray diffraction with a high-energy “white” beam synchrotron radiation source is presented. The profiling is accomplished with the aid of a highly collimated incident and scattered x-ray beams and with micro positioning of the sample-interface. The depth of the profiling is on the order of mm and the resolution of the profiling is on the order of a few microns. The technique allows the three dimensional profiling of the stress distribution in these materials.
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References
Kuntz, T., Wadley.H. and Black,D. (1993) Residual strain gradient determination in metal matrix composites by Synchrotron X-ray Energy Dispersive Diffraction Metallurgical Transactions A, 24A, 1117.
Lee, J-W., Mayo, W.E. and Tsakalakos, T. (1992) Elastic and plastic contributions to x-ray line broadening of InGaAsP/InP heterostructures, Journal of Electronic Materials, 21, 867–875.
Chassapis, C.S. and Tsakalakos, T.(1997) Multidimensional optimization of a stochastic model for X-ray diffraction from superlattices, Computer Physics Communications 99,163–179.
Panborn R.N., Yazici, R., Tsakalakos, T., Weissmann, S. and Kramer, I.R. (1980) Determination of prefacture damage in fatigued and stress-corroded materials by x-ray double crystal diffractrometry, National Bureau of Standards Special Publication 567, Proceedings of Symposium on Accuracy in Powder Diffraction held at NBS, Gaiathersburg, MD, 433–49.
see numerous references in Advances in X-ray analysis: Volume 39. Proceedings of the Forty-Fourth Annual Conference on Applications of X-Ray Analysis (Col. Springs Col., 1995), Gilfrich, J., Goldsmith, C. Huang, T., Jenkins, R., Predecki, P. K. and Smith, D. (eds.) (Plenum Press, NY, 1997).
see Microbeam Diffraction at NSLS (July 97 NSLS Newsletter).
see CHESS B1 Beamline Facilities Description.
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© 2000 Springer Science+Business Media Dordrecht
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Tsakalakos, T., Croft, M. (2000). Xrd Strain and Stress Determination in Nanostructured Films and Coatings. In: Chow, GM., Ovid’ko, I.A., Tsakalakos, T. (eds) Nanostructured Films and Coatings. NATO Science Series, vol 78. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4052-2_19
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DOI: https://doi.org/10.1007/978-94-011-4052-2_19
Publisher Name: Springer, Dordrecht
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