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Defects and Surface-Induced Effects in Advanced Perovskites pp 75–88Cite as

EPR Investigations of Small Electron and Hole Polarons in Oxide Perovskites

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Part of the book series: NATO Science Series ((ASHT,volume 77))

Abstract

Mobile charge carriers moving among equivalent sites in polar crystals tend to form polarons. Their properties are determined by the interplay between symmetry breaking interactions, such as coupling to the lattice and potential fluctuations, and those which are symmetry restoring, such as tunneling between equivalent neighbors. Polarons are classified by the alternatives ‘small – large’, ‘electron – hole’, ‘single polaron – bipolaron’, ‘free – bound’. Information on the structural properties of small electron polarons, based on EPR studies, in BaTiO3, WO3 and LiNbO3 is presented. On this firm basis some of the optical features of the polarons are interpreted. In all three cases there are indications for the presence of bipolarons also. An important polaron subclass are O- hole polarons bound to acceptor defects in perovskite crystals. Their properties, especially the optical ones, are discussed in comparison to those of free polarons.

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Authors and Affiliations

  1. Fachbereich Physik, Universität Osnabrück, D-49069, Osnabrück, Germany

    O. F. Schirmer

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  1. O. F. Schirmer
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Editors and Affiliations

  1. Department of Physics, University of Osnabrück, Germany

    Gunnar Borstel

  2. Institute of Solid State Physics, University of Latvia, Riga, Latvia

    Andris Krumins  & Donats Millers  & 

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© 2000 Springer Science+Business Media Dordrecht

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Schirmer, O.F. (2000). EPR Investigations of Small Electron and Hole Polarons in Oxide Perovskites. In: Borstel, G., Krumins, A., Millers, D. (eds) Defects and Surface-Induced Effects in Advanced Perovskites. NATO Science Series, vol 77. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4030-0_8

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  • DOI: https://doi.org/10.1007/978-94-011-4030-0_8

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-0-7923-6217-3

  • Online ISBN: 978-94-011-4030-0

  • eBook Packages: Springer Book Archive

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