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Thermal Simulations of Semiconductor Chips Using BEM

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Boundary Elements XIII
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Abstract

This paper presents thermal simulations of a semiconductor chip in a ceramic chip-carrier. This structure is modelled in a mixed environment, using a combination of conductive volumes, conductive layers and contact resistances. The boundary element method is used because this technique is more suited than any other numerical technique to implement the solution in such a mixed environment.

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References

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© 1991 Computational Mechanics Publications

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Driscart, M., De Mey, G. (1991). Thermal Simulations of Semiconductor Chips Using BEM. In: Brebbia, C.A., Gipson, G.S. (eds) Boundary Elements XIII. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-3696-9_28

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  • DOI: https://doi.org/10.1007/978-94-011-3696-9_28

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-1-85166-696-6

  • Online ISBN: 978-94-011-3696-9

  • eBook Packages: Springer Book Archive

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