Abstract
The technology of integrated circuits imposes upon their designers the need to deal with structures with distributed parameters. Figure 4.1 shows a schematic diagram of part of a digital integrated chip, consisting of an n MOS transistor with gate (G), drain (D) and source (S) as terminals, and its thin-film connection with the rest of the chip. This on-chip connection can be made by metals (Al, W), polycristaline silicon (polysilicon) or metal suicides (WSi 2 ). Alternative materials to oxide-passivated silicon substrates are saphire and gallium arsenide (Saraswat and Mohammadi [1982], Yuan et al. [1982], Passlack et al. [1990]).
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1991 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Marinov, C.A., Neittaanmäki, P. (1991). Mixed-type circuits with distributed and lumped parameters as correct models for integrated structures. In: Mathematical Models in Electrical Circuits: Theory and Applications. Mathematics and Its Applications, vol 66. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-3440-8_4
Download citation
DOI: https://doi.org/10.1007/978-94-011-3440-8_4
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-5521-5
Online ISBN: 978-94-011-3440-8
eBook Packages: Springer Book Archive