Abstract
Surface chemistry and structure is accessible to a large variety of experimental methods, each one providing a part of the necessary information that describes the microscopic structure and composition of real surfaces in its atomistic detail.
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© 1992 Springer Science+Business Media New York
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Böer, K.W. (1992). Surface Analysis. In: Survey of Semiconductor Physics. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-2912-1_3
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DOI: https://doi.org/10.1007/978-94-011-2912-1_3
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-5293-1
Online ISBN: 978-94-011-2912-1
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