Abstract
We have used scanning tunneling microscopes (STMs) operating at 4.2, 77 and 300 K, and atomic force microscopes (AFMs) operating at 300 K, to image charge-density waves (CDWs) in layered structure transition metal dichalcogenides. These materials grow in a variety of phases depending on the growth temperature and the stability of a given phase in a given temperature range. The STM and AFM results reported in this review cover data obtained on the 1T, 2H and 4Hb phases of representative dichalcogenides. Experimental results are presented for the complete range of CDW amplitudes and structures observed in these materials. The spectroscopic mode of the STM has been used to study the energy gap structure associated with the CDWs, and a systematic correlation to the strength of the CDWs has been made. The ability of the STM to detect defects and CDW domain structures is also presented.
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Coleman, R.V., Dai, Z., McNairy, W.W., Slough, C.G., Wang, C. (1992). STM & AFM of Layered Transition Metal Compounds. In: Benedek, G. (eds) Surface Properties of Layered Structures. Physics and Chemistry of Materials with Low-Dimensional Structures, vol 16. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-2684-7_2
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DOI: https://doi.org/10.1007/978-94-011-2684-7_2
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