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The characterisation of polymer surfaces by XPS and SIMS

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Polymer Characterisation

Abstract

The availability of an increasing number of techniques for the characterisation of polymeric surfaces over the last twenty years or so has lead to many important improvements in the understanding of interfacial phenomena (e.g. adhesion, wetting, printing, biocompatability) in these materials. In particular the development of X-ray photoelectron spectroscopy (XPS), as applied to polymers, has allowed a wealth of information regarding the surface elemental and functional-group composition to be obtained. Many interesting correlations between the surface composition, as determined by XPS, and interfacial phenomena have been noted. These observations have led to the realisation that the structure and properties of the outermost 5 nm or so of a polymer can control the performance of the material in many applications. As with many characterisation techniques, there are limitations on the information obtained by XPS. This has, in part, provided the impetus for developing other techniques which would complement XPS, in terms of both compositional data and surface sensitivity. Static secondary ion mass spectrometry (SSIMS) has emerged in the last ten years as one of the most powerful techniques complementary to XPS. As implied by the name of the technique, a mass spectrum representative of the surface is obtained. This chapter will give brief outlines of the two techniques and some of their applications.

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Authors
  1. H. S. Munro
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  2. S. Singh
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Editors and Affiliations

  1. The Polymer Centre, Lancaster University, Lancaster, LA1 4YW, UK

    B. J. Hunt

  2. Procter & Gamble (Health and Beauty Care Ltd), Rusham Park, Whitehall Lane, Egham, Surrey, TW20 9NW, UK

    M. I. James

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© 1993 Springer Science+Business Media Dordrecht

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Munro, H.S., Singh, S. (1993). The characterisation of polymer surfaces by XPS and SIMS. In: Hunt, B.J., James, M.I. (eds) Polymer Characterisation. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-2160-6_11

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  • DOI: https://doi.org/10.1007/978-94-011-2160-6_11

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4956-6

  • Online ISBN: 978-94-011-2160-6

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