Abstract
A university research reactor is employed to irradiate electronic components to assess radiation induced damage. The reactor facility, irradiation procedure and dosimetry are described. Semiconductor devices are irradiated following guidance set forth in military standards (MIL-STD-883C). Electrical properties of irradiated components are characterized and compared with pre-irradiation performance parameters to assess the degradation of critical parameters as a function of neutron fluence. Future experiments will investigate real-time irradiation damage effects as functions of dose rate and fluence.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Simpson, J.A., ’Introduction to the galactic cosmic radiation,’ in M.M. Shapiro (ed.), Composition and Origin of Cosmic Rays, D. Reidel Publishing Co., Dordrecht, pp. 1–24 (1983).
Lund, Niels, ’Cosmic ray abundances, elemental and isotopic,’ in M.M. Shapiro (ed.), Cosmic Radiation in Contemporary Astrophysics, D. Reidel Publishing Co., Dordrecht, pp. 1–26 (1984).
J.S. Bennion and G.M. Sandquist, ’Report to the U.S. Air Force Concerning the Neutron Irradiation of Electronics by the University of Utah Nuclear Engineering Laboratory,’ UTEC 90-19 (1989).
R.E. Dahl and H.H. Yoshikawa, ’Fast Neutrons,’ in J. Moteff (ed.), Neutron Fluence Measurements, International Atomic Energy Agency, Vienna, Chapter V (1970).
MIL-STD-883C, ’Military Standard Test Methods and Procedures for Microelectronics,’ U.S. Department of Defense (1983).
ASTM E 265-88, ’Standard Test Method for Measuring Reaction Rates and Fast Neutron Fluences by Radioactivation of Sulfur-32, ’ American Society for Testing and Materials (1988).
ASTM E 668-78, ’Standard Practice for the Application of Thermoluminescence Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices,’ American Society for Testing and Materials (Reapproved 1984).
ASTM E 720-86, ’Standard Guide for Selection of a Set of Neutron-Activation Foils for Determining Neutron Spectra Used in Radiation-Hardness Testing of Electronics,’ American Society for Testing and Materials (1986).
ASTM E 721-85, ’Standard Method for Determining Neutron Energy Spectra With Neutron-Activation Foils for Radiation-Hardness Testing of Electronics,’ American Society for Testing and Materials (1985).
ASTM E 722-85, ’Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics,’ American Society for Testing and Materials (1985).
L.W. Ricketts, Fundamentals of Nuclear Hardening of Electronic Equipment. R. Krieger Publishing Co., Malabar, Florida (1986).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1993 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Bennion, J.S., Sandquist, G.M., Sheehan, P.S., Rogers, V.C. (1993). Irradiation Damage Assessment of Electronics. In: DeWitt, R.N., Duston, D., Hyder, A.K. (eds) The Behavior of Systems in the Space Environment. NATO ASI Series, vol 245. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-2048-7_40
Download citation
DOI: https://doi.org/10.1007/978-94-011-2048-7_40
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-4907-8
Online ISBN: 978-94-011-2048-7
eBook Packages: Springer Book Archive