Abstract
In this communication we propose the association of a monomode fiber and a silicon nitride tip working both as a force detector and a near field detector. The optical signal detected by the tip is transmitted by the fiber towards a photomultiplier. Simultaneously or sequentially, the topography of the object is measured by means of a second beam reflected on the cantilever. For discriminating the two signals, each beam is modulated at a given frequency. A possible alternative is the use of two different wavelengths. Our first results show glass surface images generated by optical near field and force detection. The efficiency of silicon nitride tips could be strongly improved by piercing the very tip by ion etching. The first tentatives are very promising since holes of about 20 nanometers have been obtained.
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References
Courjon, D., Bainier, C. and Spajer, M. (1992) ‘Imaging of submicron index variations by scanning optical tunneling’, J. Vac. Sci. Technol. B, 10, 1–3.
Betzig, E., Finn, P.L. and Wiener, J.S. (1992) ‘Combined shear force and near-field scanning optical microscopy’, Appl. Phys. Lett., 60, 2484–2486.
Toledo-Crow, R., Yang, P.C., Chen, Y. and Vaez-Iravani, M. (1992) ‘Near-field differential scanning microscope with atomic force regulation’, Appl. Phys.Lett., 60, 2957–2959.
Van Hulst, N., Moers, M., Noordman, O., Faulkner, T., Segerink, F., Van der Werf, K., de Grooth, B. and Böiger, B. (1992) ‘Operation of a scanning near field optical microscope in reflection in combination with a scanning force microscope’, SPIE Proceedings’ scanning probe microscopies’, 1639, 36–43.
Vigoureux, J.M. (1991) ‘Polynomial formulation of reflection and transmission by stratified planar structures’, J.O.S.A. A, 8, 1697–1701.
Nazar, F.M. (1979) ‘Absorption in silicon nitride films’, Short notes in JPN. J.Appl. Phys., 18, 1181–1182.
Allegrini, ML, Ascoli, C., Baschieri, P., Dinelli, F., Frediani, C., Lio, A. and Mariani, T. (1992) ‘Laser thermal effects on atomic force microscope cantilevers’, Ultramicroscopy, to be published.
Lee, K. L., Abraham, D. W., Secord, F. and Landstien, L., (1991)’ submicron Si trenth profiling with an electron-beam fabricated atomic force microscope tip’, J. Vac. Sci. Technol. B, 9, 3562–3568.
Roberts, A. (1992) ‘Theoretical considerations in optical near-field microscopy: probe-sample interaction and probe positioning effects’, in this issue.
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© 1993 Springer Science+Business Media Dordrecht
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Baida, F., Courjon, D., Tribillon, G. (1993). Combination of a Fiber and a Silicon Nitride Tip as a Bifunctional Detector; First Results and Perspectives. In: Pohl, D.W., Courjon, D. (eds) Near Field Optics. NATO ASI Series, vol 242. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1978-8_9
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DOI: https://doi.org/10.1007/978-94-011-1978-8_9
Publisher Name: Springer, Dordrecht
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