Abstract
One of the most promising extension of the photon scanning tunneling microscope (PSTM) is its use as a locally resolved spectroscopic tool. The infrared (IR) spectral window offers a wide variety of interesting applications since many materials have a well-defined signature in this range. We have undertaken the experimental modifications that are necessary to operate the existing PSTM’s in the IR domain. In this work, we present preliminary data obtained with two IR light sources: an extended source (Globar type) and the free electron IR laser source (CLIO) available at LURE (Orsay). In both cases, the evanescent field has been detected with a fluoride glass optical fiber and the characteristic decay is reproducibly observed. On the basis of these results, we discuss the current limits of spatial and spectral resolutions. Mainly, we conclude that a spectral resolution of about 10 cm−1 over an area of 1μm × μm is possible to achieve.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Berquier J.M., Buffeteau T., Chartier P., Desbat B. and Arribart H. “Détermination par spectroscopie infrarouge de la localisation de la rupture d’adhésion verre-élastique” accepted for publication in Compte-rendu de l’Académie des Sciences (1992).
Courjon D., Sarayeddine K. and Spajer M. “Scanning tunneling optical microscopy” Opt Com 71 (1989), 23.
Creuzet F., Ryschenkow Y. and Arribart H. “A new tool for adhesion science: the atomic force microscope” accepted for publication in J. of Adhesion (1992)
De Fornel F. and Goudonnet J.P. European Patent submitted on Oct 31, 1990.“Procedé d’analyse spectroscopique ponctuelle de la lumière diffractée ou absorbée par une substance placée dans un champ proche”.
Kaizuka H. and Siu B. “A simple way to reduce hysteresis and creep when using piezoelectric actuator” Jap. J. Appl. Phys. 27 (1988), 773.
Ortéga J.M. and Billardon M. “Le laser à électrons libres” Pour la science (1986), 91.
Proceedings of the Sixth International Conference on Scanning Tunneling Microscopy, Edited by Descouts P. and Siegenthaler H. Ultramicroscopy 42-44 (1992)
Reddick R.C., Warmack R.J. and Ferrell T.L. “New form of scanning optical microscopy” Phys. Rev. B 39 (1989), 767.
Salomon L. “Théorie et mise au point d’un microscope à effet tunnel optique” Thesis, Université de Bourgogne, February 1991.
Spajer M, Courjon D., Sarayeddine K., Jalocha A. and Vigoureux J.-M. “Microscopie en champ proche par réflexion” J. Phys. III 1 (1991) 1–12
Zhu S., Yu A.W., Hawley D. and Roy R. “Frustrated total internal reflection: a demonstration and review” Am. J. Phys. 54 (1986), 601.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1993 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Piednoir, A., Creuzet, F., Licoppe, C., De Fornel, F. (1993). First Specifications of a PSTM Working In the Infrared. In: Pohl, D.W., Courjon, D. (eds) Near Field Optics. NATO ASI Series, vol 242. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1978-8_35
Download citation
DOI: https://doi.org/10.1007/978-94-011-1978-8_35
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-4873-6
Online ISBN: 978-94-011-1978-8
eBook Packages: Springer Book Archive