Abstract
Two kinds of probe are actually used in scanning near-field optical microscopy: dielectric tip and small aperture probe. The purpose of this paper is to compare theoretically the two different probes by calculating and comparing the images of a same sample. We choose to describe a Scanning Tunneling Optical Microscope (S.T.O.M.) where the sample is illuminated by total internal reflection. The dielectric tip is modeled as a small scattering dipolar center. The intensity detected by the other probe is calculated by using the diffraction theory of Bethe and Bouwkamp. It is shown that the two probes do not detect the same things: the dielectric tip picks up the square modulus of the electric near-field. The other probe is sensible both to the electric and magnetic fields. The models are used to calculate images of a two-dimensional object (a letter) of dimension smaller than the wavelength. The images are quite different and are very sensitive to polarization of the incident field.
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© 1993 Springer Science+Business Media Dordrecht
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Barchiesi, D., van Labeke, D. (1993). Scanning Tunneling Optical Microscopy (STOM): Theoretical Study of Polarization Effects with two Models of Tip. In: Pohl, D.W., Courjon, D. (eds) Near Field Optics. NATO ASI Series, vol 242. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1978-8_20
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DOI: https://doi.org/10.1007/978-94-011-1978-8_20
Publisher Name: Springer, Dordrecht
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