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Principles and Applications of Near-Field Scanning Optical Microscopy (NSOM)

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Near Field Optics

Part of the book series: NATO ASI Series ((NSSE,volume 242))

Abstract

The technology of near-field scanning optical microscopy has advanced to the point where it can be applied to a broad range of problems on a routine basis. Several recent examples are shown to support this assertion.

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References

  1. Betzig, E., Trautman, J.K., Harris, T.D., Weiner, J.S., and Kostelak, R.L. (1991) ‘Breaking the diffraction barrier: optical microscopy on a nanometric scale’, Science 251, 1468–1470.

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  3. Betzig, E., Weiner, J.S., and Kostelak, R.L., unpublished results. Copies available upon request.

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  10. Work in collaboration with F. Naftolin and C. Leranth, Dept. of Obstetrics and Gynecology, Yale University.

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  11. Betzig, E., Trautman, J.K., Weiner, J.S., Harris, T.D., and Wolfe, R. (1992) ‘Polarization contrast in near-field scanning optical microscopy’, Appl. Opt. 31, 4563–4568.

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  12. Betzig, E., Trautman, J.K., Wolfe, R., Gyorgy, E.M., Finn, P.L., Kryder, M.H., and Chang, C.-H. (1992) ‘Near-field magneto-optics and high density data storage’, Appl. Phys. Lett. 61, 142–144.

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  13. Betzig, E., Chichester, R.J., Lanni, F., LaRocca, G., and Taylor, D.L., manuscript in preparation.

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  14. Work in collaboration with F. Lanni, G. LaRocca, and D.L. Taylor, Center for Light Microscope Imaging and Biotechnology, Carnegie Mellon University.

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© 1993 Springer Science+Business Media Dordrecht

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Betzig, E. (1993). Principles and Applications of Near-Field Scanning Optical Microscopy (NSOM). In: Pohl, D.W., Courjon, D. (eds) Near Field Optics. NATO ASI Series, vol 242. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1978-8_2

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  • DOI: https://doi.org/10.1007/978-94-011-1978-8_2

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4873-6

  • Online ISBN: 978-94-011-1978-8

  • eBook Packages: Springer Book Archive

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