Abstract
Reflection near field microscopy is potentially more accurate and efficient than STOM, its advantage beeing a localized illumination of the surface. Its working in far field and near field mode is described and the experimental z-curve is analyzed. A solution for partially solving the inherent problem of S/N ratio is presented. It uses electronic and numerical z-derivation of the signal.
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© 1993 Springer Science+Business Media Dordrecht
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Spajer, M., Jalocha, A. (1993). The Reflection Near Field Optical Microscope: An Alternative to STOM. In: Pohl, D.W., Courjon, D. (eds) Near Field Optics. NATO ASI Series, vol 242. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1978-8_11
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DOI: https://doi.org/10.1007/978-94-011-1978-8_11
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-4873-6
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