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Application of Surface Analysis to High Performance Polymeric Adhesives and Composites

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The Interfacial Interactions in Polymeric Composites

Part of the book series: NATO ASI Series ((NSSE,volume 230))

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Abstract

The paper details the use of scanning electron microscopy, surface reflectance infrared spectroscopy, Auger electron spectroscopy, ion scattering spectroscopy, secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy in the analysis of polymeric adhesives and composites. A brief review of the principle of each surface analytical technique will be followed by application of the technique to interfacial adhesion with an emphasis on polymer/metal, fiber/matrix, and composite/composite adhesion.

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Authors and Affiliations

  1. Chemistry Department Center for Adhesive and Sealant Science Center for Composite Materials and Structures, NSF Science and Technology Center Virginia Institute for Material Systems Virginia Polytechnic Institute and State University, Blacksburg, VA, 24061, USA

    J. P. Wightman

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  1. J. P. Wightman
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Editors and Affiliations

  1. Department of Chemistry, Polymer Science and Technical Program, Middle East Technological University, Ankara, Turkey

    Güneri Akovali

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Wightman, J.P. (1993). Application of Surface Analysis to High Performance Polymeric Adhesives and Composites. In: Akovali, G. (eds) The Interfacial Interactions in Polymeric Composites. NATO ASI Series, vol 230. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1642-8_7

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  • DOI: https://doi.org/10.1007/978-94-011-1642-8_7

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4717-3

  • Online ISBN: 978-94-011-1642-8

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