Abstract
Crystallization of amorphous thin films of germanium obtained by physical vapour deposition was achieved during deposition by appropriate heating of the substrate or after deposition by annealing at elevated temperatures. The temperature at which the crystallization starts can be markedly lowered and the crystallinity of the films obtained can be substantially increased by capping the crystalline substrates with amorphous carbon layers. A combination of substrate capping and post-deposition annealing leads to almost completely crystalline films that exhibit a heavily twinned structure. The role of twinning in the structural evolution of the crystalline fabric is studied by high resolution electron microscopy (HREM).
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References
Nakamura, A., Emoto, F., Fujii, E., Yainamoto, A., Uemoto, Y., Senda, K. and Kano, G. (1989) ‘Analysis of solid phase crystallization in amorphized polycrystalline Si films on quartz substrates’ J. Appl. Phys. 66, 4248–4251.
Okabe, T., Kagawa, Y. and Takai, S., (1991) ‘High resolution electron microscopic observation on a pentagonal nucleus formed in amorphous germanium films’, Phil. Mag. Lett. 63, 233–239.
Bats Tone, J.L. (1993) ‘In situ crystallization of amorphous silicon in the transmission electron microscope’, Phil. Mag. A 67, 51–72.
Hofmeister, H. and Junghanns, T. (1993) ‘Multiple twinning in the solid phase recrystallization of amorphous germanium’, Materials Science Forum 113–115, 631–636.
Matsumoto, S. and Matsui, Y. (1983) ‘Electron microscopic observation of diamond particles grown from the vapour phase’, J. Mater. Sci. 18, 1785–1793.
Drosd, R. and Washbum, J. (1982) ‘Some observations on the amorphous to crystalline transformation in silicon’, J. Appl. Phys. 53, 397–403.
Shechtman, D., Hutchison, J.L., Robins, L.H., Farabaugh, E.N. and Feldman, A. (1993) ‘Growth defects in diamond films’, J. Mater. Res. 8, 473–479.
Hofmeister, H., Bardamid, A.F., Junghanns, T. and Nepijko, S.A. (1991) ‘Crystalline particles with multiply twinned structure in amorphous films of germanium’, Thin Solid Films 205, 20–24.
Koleshko, V.M., Belitsky, V.F. and Kiryushin, I.V. (1988) ‘Mechanical stress in low pressure chemically vapour deposited silicon films’, Thin Solid Films 165, 181–191.
Miura, H., Ohta, H. and Okamoto, N. (1992) ‘Crystallization-induced stress in silicon films’, Appl. Phys. Lett. 60, 2746–2748.
Howie, A. and Marks, L.D. (1984) ‘Elastic strains and the energy balance for multiply twinned particles’, Phil. Mag. A 49, 95–109.
Luyten, W., van Tendeloo, G., Amelinckx, S. and Collins, J.L. (1992) ‘Electron microscopy study of defects in synthetic diamond layers’, Phil. Mag. A 66, 899–915.
Wegscheider, W., Eberl, K., Abstreiter, G., Cerva, H. and Oppolzer, H. (1990) ‘Novel relaxation process in strained Si/Ge superlattices grown on Ge(001)’, Appl. Phys. Lett. 57, 1496–1498.
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© 1994 Springer Science+Business Media Dordrecht
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Hofmeister, H. (1994). The Structural Evolution of Nanocrystalline Thin Films of Germanium. In: Hadjipanayis, G.C., Siegel, R.W. (eds) Nanophase Materials. NATO ASI Series, vol 260. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1076-1_26
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DOI: https://doi.org/10.1007/978-94-011-1076-1_26
Publisher Name: Springer, Dordrecht
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