Skip to main content

Part of the book series: NATO ASI Series ((NSSE,volume 262))

  • 259 Accesses

Abstract

In this presentation, I will provide an illustrative overview of some research projects going on at NOI, which are relevant to NDE. Areas covered in particular will be in information processing and in optical metrology. Example of projects presented will include various optical machine vision systems applied to industrial inspection, a fringe pattern analysis software applied to Moiré and holographic interferometry and some of the signal processing methods such as classifiers in optical spectrometric instrumentation and in remote sensing multi-spectral images.

this contribution: abstract only

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

eBook
USD 16.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1994 Springer Science+Business Media Dordrecht

About this chapter

Cite this chapter

Gingras, D. (1994). Optics and Information Processing At NOI: A Good Match For NDE. In: Maldague, X.P.V. (eds) Advances in Signal Processing for Nondestructive Evaluation of Materials. NATO ASI Series, vol 262. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1056-3_36

Download citation

  • DOI: https://doi.org/10.1007/978-94-011-1056-3_36

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4459-2

  • Online ISBN: 978-94-011-1056-3

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics