Abstract
Nanobeam analytical electron microscopy and high-resolution electron microscopy have been used to characterize both the local composition as well as the thickness of the amorphous intergranular silicate-rich film in high-purity Si3N4 ceramics doped with different levels of Ca impurities. Grain boundary films could be detected in all ceramics. The films always contained Si (cation) and O and N (anions). Ca was detected at both grain boundary junctions and triple junctions for all materials doped with different levels of Ca. The thickness h of the intergranular films depends sensitively on the Ca content. In undoped materials h is 1.0±0.1 nm. With increasing Ca content the thickness h decreased for a dopant of 80 ppm Ca but increased with further additions of Ca. Variations in film thickness and composition can be semi-quantitatively understood in terms of different long-range interatomic forces acting normal to the film.
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Tanaka, I. et al. (1994). Compositions and Thicknesses of Grain Boundary Films in Ca-Doped Silicon Nitride Ceramics. In: Hoffmann, M.J., Petzow, G. (eds) Tailoring of Mechanical Properties of Si3N4 Ceramics. NATO ASI Series, vol 276. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0992-5_20
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DOI: https://doi.org/10.1007/978-94-011-0992-5_20
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