Abstract
Surface reactions play a critical role in the behaviour and properties of clays and, as a result, many experimental and theoretical approaches have been developed for the physical and physico-chemical description of the interfacial regions involved in these reactions. These include measurements of the physical extent (specific surface area) and the topography of interfaces (porosity and surface roughness) using low-temperature gas adsorption methods, water vapour adsorption and mercury intrusion porosimetry (Gregg and Sing, 1982). The physico-chemical methods include the measurement of ion-exchange phenomena (Sposito, 1990) and the development of complex computer-based models of interfacial regions, whose properties are defined on the basis of a series of thermodynamic descriptors (Davis and Kent, 1990). Fewer methods are available for direct chemical and structural characterization of the clay surface, yet, in order to describe the mechanism of surface-controlled reactions on a molecular level and to validate mathematical models of interfacial reactions, direct measurements are required. Against this background, the development and application of highly surface-specific methods, such as photoelectron spectroscopy, has come at an opportune time.
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Paterson, E., Swaffield, R. (1994). X-ray photoelectron spectroscopy. In: Wilson, M.J. (eds) Clay Mineralogy: Spectroscopic and Chemical Determinative Methods. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0727-3_6
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DOI: https://doi.org/10.1007/978-94-011-0727-3_6
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