Abstract
It was recently shown, that the tetrahedral tip can be used as a probe for Scanning Near- Field Optical Microscopy (SNOM) at a lateral resolution of 30 nm. The optical signal as obtained in an Inverse Photon Scanning Tunneling Microscope configuration was used to control the distance between tip and object during the scan. The optical signal is however not only determined by the distance between tip and object. To explore the resolution limits of our SNOM we need an independent signal for controlling the distance during a scan more accurately. We tested the possibility to use the tetrahedral tip for simultaneous SNOM and STM operation by using the tetrahedral tip as a probe for STM alone. In first experiments atomic resolution was obtained on graphite, and a resolution in the nm range, superior to the one obtained by us in AFM images could be demonstrated on test samples, which are comparable to the ones used for the SNOM experiments.
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References
E. Betzig, J. Chichester, (1993), “Single Molecules Observed by Near-Field Scanning Optical Microscopy”. Science 262, 1422–1425.
Kuhn, H. (1968). “On possible ways of assembling simple organised systems of molecules”. In: “Structural Chemistry and Molecular Biology”. A. Rich and N. Davidson (eds.), Freeman, San Francisco, 566–571.
Fischer U. Ch., H. P. Zingsheim (1982). “Submicroscopic Contact Imaging with Visible Light by Energy Transfer”. Appl. Phys. Lett. 40, 195.
Fischer U. Ch. (1990). “Resolution and Contrast Generation in Scanning Near Field Optical Microscopy”. In: R. J. Behm et al. (eds.), “Scanning Tunneling Microscopy and Related Methods”. Kluwer Academic Publishers, Netherlands, 475–496.
Fischer U.C., D.W. Pohl (1989). “Observation of Single Particle Plasmons by Near-Field Optical Microscopy”. Phys. Rev. Lett. 62, 458–461.
Fischer U.C., M. Zapletal (1991). “The Concept of the Coaxial Tip as a Probe for Scanning Near Field Optical Microscopy and Steps towards a Realisation.” Ultramicroscopy 42–44, 393–398.
Fischer, U.C. (1993). “The Tetrahedral Tip as a Probe for Scanning Near-Field Optical Microscopy”. In: “Near Field Optics”. D.W. Pohl and D. Courjon eds. Kluwer Academic Publ. Netherland, 255–262.
Fischer, U.C., J. Koglin, H. Fuchs. (1994), “The Tetrahedral Tip as a Probe for Scanning Near-Field Optical Microscopy at 30 nm Resolution.” Journal Microscopy dec 94, in print
Ruppin R. (1982). “Spherical and Cylindrical Surface Polaritons in Solids.” In A.D. Boardman Ed., “Electromagnetic Surface Modes”, John Wiley & Sons Ltd, 345–397.
Raether H. (1988). “Surface Plasmons on Smooth and Rough Surfaces and on Gratings”, in G. Höhler Ed.: Springer Tracts in Modern Physics 111. Springer, Berlin.
Danzebrink H. U., U. C. Fischer (1993) “The Concept of an Optoelectronic Probe for Near Field Microscopy.” In: “Near Field Optics.” D.W. Pohl and D. Courjon eds. Kluwer Academic Publ., Netherland,. 303–308.
Hecht B., H. Heinzelmann, D.W. Pohl (1993). “Combined Aperture SNOM/PSTM: Best of both worlds?” Proceedings of the 2nd Conference on Near Field Optics, Rayleigh NC. USA, Oct. 20–22. (Ultramicroscopy, in print)
Carniglia, C.K., L. Mandel, K.H. Drexhage. (1972). “Absorption and Emission of Evanescent Photons.” J. Opt Soc. Am. 62, 479–486.
Fischer, U.Ch., H.P. Zingshgeim (1981). “Submicroscopic Pattern Replication with Visible Light”. J. Vac. Sci. Technol.19, 881–885.
Deckman, H.W., J.H. Dunsmuir (1982). “Natural Lithography”. Appl. Phys. Lett 41(4), 377–379.
Dürig, U., D.W. Pohl, F. Rohner (1986). Near-field optical-scanning microscopy. J. Appl. Phys. 59 (10), 3318–3327.
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© 1995 Springer Science+Business Media Dordrecht
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Koglin, J., Fischer, U.C., Brzoska, K.D., Göhde, W., Fuchs, H. (1995). The Tetrahedral Tip as a Probe for Scanning Near-Field Optical and for Scanning Tunneling Microscopy. In: Marti, O., Möller, R. (eds) Photons and Local Probes. NATO ASI Series, vol 300. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0423-4_6
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DOI: https://doi.org/10.1007/978-94-011-0423-4_6
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