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Reflection-Mode SNOM

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Photons and Local Probes

Part of the book series: NATO ASI Series ((NSSE,volume 300))

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Abstract

The design of a Reflection-Mode aperture SNOM(R-SNOM) with macroscopic collection of the reflected light is presented. This instrument incorporates a Shear-Force feedback mechanism, and also works as an STM, in which case it exhibits lateral resolution of 2–3nm. The light at 685nm is coupled into a tapered and metallised single-mode optical fibre. It is then reflected from the sample, collected using a microscope objective, and detected using a PMT. The detection of the Shear-Force signal is based on shadowing of a laser beam by an oscillating fibre. Some initial studies of Shear-Force are presented, along with the first scanning optical images obtained.

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References

  1. Heinzelman H. and Pohl, D.W. (1994) Scanning Near-Field Optical Microscopy, Appl. Phys. A, spec. issue on Scanning Probe Microscopies

    Google Scholar 

  2. Betzig, E. and Trautman, J.K. (1992) Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction Limit, Science 257, 189–195

    Article  ADS  Google Scholar 

  3. Bozhevolnyi, S.I., Xiao, M. and Keller, M. External-reflection near-field optical microscope with cross-polarized detection (1994) Applied Optics 33(5), 876–880

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  4. Moyer, P.:J., Paesler, M.A. Reflection shear-force/near-field scanning optical microscopy in Near-Field Optics, NATO ASI Ser. E, Vol. 242, Kluwer 1993.

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  5. Bielefeldt H., Horsch I., Krausch G., Mlynek J. and Marti O. (1993) Reflection scanning microscopy & spectroscopy of opaque samples, preprint submitted to Applied Physics A

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  6. Betzig E., Trautman J.K., Wolfe R., Gyorgy E.M., Finn P.L., Kryder M.H. and Chang C.H. (1992) Near-field magneto-optics and high density data storage, Appl. Phys Lett. 61(2), 142–144

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© 1995 Springer Science+Business Media Dordrecht

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Durkan, C., Shvets, I.V. (1995). Reflection-Mode SNOM. In: Marti, O., Möller, R. (eds) Photons and Local Probes. NATO ASI Series, vol 300. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0423-4_12

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  • DOI: https://doi.org/10.1007/978-94-011-0423-4_12

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4189-8

  • Online ISBN: 978-94-011-0423-4

  • eBook Packages: Springer Book Archive

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