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Pressure Effects of Optical Frequency in External Cavity Diode Lasers

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Trends in Optical Fibre Metrology and Standards

Part of the book series: NATO ASI Series ((NSSE,volume 285))

Abstract

A report is given on the construction of a passively stabilised external cavity diode laser operating at 780 nm. The relative frequency stability obtained is 10-8. The sensitivity of laser frequency to changes in air pressure was studied and subsequently eliminated.

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Authors and Affiliations

  1. Helsinky Univ. of Technology, Otakaari 5A, Espoo, FI-02150, Finland

    Hannu Talvitie, Hanne Ludvigsen, Antti Pietiläinen & Erkki Ikonen

  2. Chalmers Univ. Technology, Gothenburg, S-41296, Sweden

    Johan Åman

  3. Swedish Nat., Testing and Research Institute, Bås, S-50115, Sweden

    Leslie Pendrill

Authors
  1. Hannu Talvitie
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  2. Johan Åman
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  3. Hanne Ludvigsen
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  4. Antti Pietiläinen
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  5. Leslie Pendrill
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  6. Erkki Ikonen
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Editor information

Editors and Affiliations

  1. CETO — Centre de Ciências e Tecnologias Ópticas, Universidade do Porto, Porto, Portugal

    Olivério D. D. Soares

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© 1995 Springer Science+Business Media Dordrecht

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Talvitie, H., Åman, J., Ludvigsen, H., Pietiläinen, A., Pendrill, L., Ikonen, E. (1995). Pressure Effects of Optical Frequency in External Cavity Diode Lasers. In: Soares, O.D.D. (eds) Trends in Optical Fibre Metrology and Standards. NATO ASI Series, vol 285. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0035-9_51

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  • DOI: https://doi.org/10.1007/978-94-011-0035-9_51

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4020-4

  • Online ISBN: 978-94-011-0035-9

  • eBook Packages: Springer Book Archive

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