Abstract
Soft x-ray absorption and emission spectroscopy is being used in order to investigate the electronic structure of nanostructured materials. Due to the photon-in photon-out nature of the processes, these techniques are well suited for the study of nanostructures and nanocomposite materials. In this overview, results are presented on the local partial density of occupied and unoccupied states in semiconductor systems (porous silicon, CdS nanocrystallites) and molecular nanostructures based on carbon cages (doped single wall carbon nanotubes, (C59N)2). The additional possibility to momentum selective information by resonant inelastic soft x-ray scattering is explained and discussed in the context of nanostructures.
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Eisebitt, S., Eberhardt, W. (2000). Soft X-Ray Spectroscopy as a Probe of the Electronic Structure of Nanostructured Solids. In: Pavesi, L., Buzaneva, E. (eds) Frontiers of Nano-Optoelectronic Systems. NATO Science Series, vol 6. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0890-7_23
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DOI: https://doi.org/10.1007/978-94-010-0890-7_23
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