Dissipation Mechanisms Studied by Dynamic Force Microscopies
The dissipation mechanisms of contact force microscopy on solid surfaces are related to the fast motion during the slip process. Different degrees of freedom can be excited, such as phonons or electronic excitations. The dissipation mechanisms of dynamic force microscopy (DFM) were recently investigated due to the improvement in large amplitude DFM, also called dissipation force microscopy. Experimental methods to determine damping with DFM will be discussed. When an electrical field is applied between probing tip and sample, damping is observed, which depends on voltage. This type of damping is related to mirror charges, which move in the sample and/or tip because of the motion of the cantilever. When the contact potential is compensated, this long-range part is minimized. Under these conditions, only short-range damping can be measured, which appears at distances of about lnm and increases exponentially with closer separation. Recent models of this type of damping show, that there might be a relationship to the local phonon density.
KeywordsPhase Lock Loop Excitation Signal Distance Curve Conservative Force Close Separation
Unable to display preview. Download preview PDF.
- Bammerlin, M. et al. (1998) “True Atomic Resolution on the Surface of an Insulator via Ultrahigh Vacuum Dynamic Force Microscopy”, Probe Microscopy 1, 3–7.Google Scholar
- Dürig, U. (2000b)“Interaction sensing in dynamic force microscopy”, New Journal of Physics 2, 5.1–5.12.Google Scholar
- Gauthier, M., et al. (2000) 3rd Workshop of Non-contact AFM, Hamburg, to appear in Appl. Phys. A.Google Scholar
- Israelachvili, J.N. (1985) Intermolecular and Surface Forces, Academic Press, London.Google Scholar
- Loppacher, Ch., Bammerlin, M., Guggisberg, M., Schär, S., Bennewitz, R., Baratoff, A., Meyer, E., Güntherodt, H.-J. (2000a) “Dynamic force microscopy of copper surfaces-Atomic resolution and distance dependence of tip-sample interaction and tunneling current”, submitted to Phys. Rev. B. Google Scholar
- Loppacher, C., Bennewitz, R., Pfeiffer, O., Guggisberg, M., Bammerlin, M., Schär, S., Barwich, V., Baratoff, A and Meyer, E. (2000b) “Experimental Aspects of Dissipation Force Microscopy”, to appear in Phys. Rev. B. Google Scholar
- McClelland, G.M., Erlandsson, R., and Chiang, S. (1987) in Review of Progress in Quantitative Non-Destructrive Evaluation, edited byD.O. Thompson and D. E. Chimenti (Plenum, New York), Vol. 6B, p. 1307–1312.Google Scholar
- Sasaki, N. et al. (2000), 3rd Workshop of Non-contact AFM, Hamburg, to appear in Appl. Phys. A.Google Scholar