Abstract
We present the technique of scanning polarization force microscopy (SPFM), which is based on the use of electrostatic forces in an atomic force microscope. Although, traditionally, electrostatic forces have been used only for imaging of electrically conductive substrates (metal and doped semiconductors), it can be used on insulating materials as well. This is because the electric field at the sharp tip of a conductive AFM cantilever (biased relative to a remote ground) is strong and polarizes the substrate to create an image charge that depends on the local dielectric properties. We will show applications of SPFM to studies of wetting and spreading of various liquids, in particular, the lubricants used in computer hard disks.
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Salmeron, M. (2001). Nanoscale Wetting and De-Wetting of Lubricants with Scanning Polarization Force Microscopy. In: Bhushan, B. (eds) Fundamentals of Tribology and Bridging the Gap Between the Macro- and Micro/Nanoscales. NATO Science Series, vol 10. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0736-8_49
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DOI: https://doi.org/10.1007/978-94-010-0736-8_49
Publisher Name: Springer, Dordrecht
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