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Photoemission Studies of Bimetallic Ultrathin Films: Au-Ni on Yttria-Stabilised ZRO2(100)

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Atomistic Aspects of Epitaxial Growth

Part of the book series: NATO Science Series ((NAII,volume 65))

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Abstract

Ultrathin bimetallic Au-Ni films vapor-deposited on yttria-sta- bilized ZRO2(100) were characterized by X-ray photoelectron spec- troscopy (XPS) and temperature-programmed desorption (TPD) of CO. The photoemission results indicate that, upon co-deposition of the two metals, the Ni signal intensity is significantly lower than that from pure Ni/YSZ, whereas the corresponding Au signal is practically unaffected by the presence of Ni. The binding energies of the Ni XPS peaks were not affected by co-deposited Au for Au/Ni atomic ratios close to unity, but the XPS Au 4f levels were shifted by 0.2 eV towards lower binding energy with respect to the corresponding values of Au/YSZ for very small Au/Ni atomic ratios in the bimetallic film. CO adsorption/desorption was used as a probe of the reactivity of Ni surface atoms as modified by co-deposited Au. Strong attenuation of the overall TPD curves was observed in all cases, accompanied by a shift of the main peak to lower temperatures for very small Au/Ni atomic ratios in the bimetallic film. Taken together, these results can be understood in terms of a simple picture in which Au atoms always segregate on the surface, leading to the complete covering of the Ni clusters for large Au/Ni atomic ratios, and to a partial intermixing of Au and Ni atoms in the outermost surface layer for small Au/Ni atomic ratios.

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Kennou, S., Zafeiratos, S. (2002). Photoemission Studies of Bimetallic Ultrathin Films: Au-Ni on Yttria-Stabilised ZRO2(100). In: Kotrla, M., Papanicolaou, N.I., Vvedensky, D.D., Wille, L.T. (eds) Atomistic Aspects of Epitaxial Growth. NATO Science Series, vol 65. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0391-9_43

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  • DOI: https://doi.org/10.1007/978-94-010-0391-9_43

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-1-4020-0675-3

  • Online ISBN: 978-94-010-0391-9

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