Abstract
We introduce a general method for describing the morphological evolution of coherent heteroepitaxial films based on linear elasticity. The substrate and film are modelled as discrete layers of continuous material whose lateral and vertical extents are measured in discrete atomic-scale units. The force-balance equations are obtained from a variational calculation of a suitably discretized form of the total elastic energy. The continuum limit of these equations and the boundary conditions along straight boundaries reproduce standard results of linear elasticity theory, but the boundary conditions at corners have no such analogue. We apply our methodology to the step-bunching instability on a one-dimensional strained vicinal surface and discuss the effects of epilayer thickness, elastic constants, and the misfit strain on the equilibration of the surface toward the bunched state.
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Schindler, A.C., Vvedensky, D.D., Gyure, M.F., Simms, G.D., Caflisch, R.E., Connell, C. (2002). Atomistic and Continuum Elastic Effects in Heteroepitaxial Systems. In: Kotrla, M., Papanicolaou, N.I., Vvedensky, D.D., Wille, L.T. (eds) Atomistic Aspects of Epitaxial Growth. NATO Science Series, vol 65. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0391-9_26
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DOI: https://doi.org/10.1007/978-94-010-0391-9_26
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