Abstract
Scanning Probe Microscopy (SPM) is one of the most powerful techniques allowing us to image, manipulate and modify matter at the nanometer scale. However, when imaging small cluster systems, the simple topographic interpretation could be misleading. We show STM images of small Ni clusters deposited on graphite (HOPG) substrate where they appear once as protrusions and secondly as hollows due to the nonlinear dependence on the density of states (DOS) vs. energy. Our results also show that the apparent height of imaged clusters is much closer to the real value of cluster diameter than an apparent diameter as it is seen in the STM images.
Electrochemical STM (ECSTM) allows “in situ” investigations of the processes taking place at the electrode-electrolyte interface. It is shown how the desired surface reconstruction can be induced on surfaces via potential control in the case of Tl monolayer deposited on Au(111) substrate. It is also shown that the observation of the building up and dissolution processes of Cu nanostructures can be traced in situ and in real time using ECSTM with the atomic resolution.
Atomic Force Microscopy (AFM) is suitable for investigation of clusters deposited on solid surfaces independently of their electronic properties. We present typical AFM images of Cr clusters deposited on Au/mica as well as AFM images which show the contrast between the Co metallic core and the surrounding ligand layer when using so called phase imaging option.
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References
Binnig G., Rohrer H. (1982) Scanning tunnelling microscopy, Helv. Phys. Acta 55, 726–735.
Binnig G., Quate C.F., Gerber C. (1986) Atomic force microscopy, Phys. Rev. Lett. 56, 933–936.
Fowler R.H., Nordheim L. (1928) Electron emission in intense electric fields, Proc. R. Soc., London A 119, 173–181.
Simmons J.G. (1963) Electric tunnel effect between dissimilar electrodes separated by a thin insulating film, J. of Appl. Phys. 34, 2581–2590.
Takayanagi K., Tanishiro Y., Takahashi M., Takahashi S. (1985) Structural analysis of Si(111)-7x7 by UHV-transmission electron diffraction and microscopy, J. Vac. Sci. Technol. A 3(3), 1502–1506.
Magnussen O.M., Hollos J., Nichols R.J., Kolb D.M., Behm R.J. (1990) Atomic structure of Cu adlayers on Au(100) and Au(111) electrodes observed by in situ STM, Phys.Rev.Lelt. 63, 2929–2933.
Wang J.X., Adzic R.R., Ocko B.M. (1993) X-ray scattering study of Tl adlayers on Au(111) electrode in alkaline solutions — metal monolaycr, OH” coadsorption and oxide formation, J.Phys.Chem. 97, 9754–9759.
Polewska W., Wang J.X, Ocko B.M., Adzic R.R. (1994) Scanning tunneling microscopy of electrodeposited Tl monolayers on Au(111) in alkaline solution, J. of Electrocutai. Chem. 376, 41–47.
Magnussen O.M., Vogt M.R. (2000) Dynamics of individual kinks during crystal dissolution, Phys. Rev. Lett. 82, 357–360.
Magnussen O.M., Zitzler, L., Gleich B., Vogt M.R. and Behm R.J. (2001) ln-situ atomic scale studies of the mechanism and dynamics of metal dissolution by high-speed STM”, Electrochim. Acta 46, 3725–3733.
Magnussen O.M., Polewska W., Zitzler L. and Behm R.J. (2002) In-situ atomic scale Studies of the mechanism and dynamics of metal dissolution by high-speed STM, submitted to Faraday Disscussion.
Vogt M.R., Lachenwitzer A., Magnussen O.M. and Behm R.J. (1998) In-situ STM study of the initial stages of corrosion of Cu(100) electrodes in sulfuric and hydrochloric acid solution, Surf. Sci 399, 49–69.
Wiesendanger R. (1994) Scanning Probe Microscopy and Spectroscopy; Methods and Applications. Cambridge: University Press.
Giersig M., Hilgendorff M., (1999) The preparation of ordered colloidal magnetic particles by magnetophoretic deposition, J. Phys. D: Appl. Phys. 32, L111–L113.
Hihara T., Sumiyama K., (1998) Formation and size control of a Ni cluster by plasma gas condensation, J. Appl. Phys. 84, 5270–5276.
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© 2003 Springer Science+Business Media Dordrecht
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Polewska, W., Czajka, R., Gutek, J., Hihara, T., Kasuya, A. (2003). Scanning Probe Microscopy Characterization of Cluster Systems. In: Liz-Marzán, L.M., Giersig, M. (eds) Low-Dimensional Systems: Theory, Preparation, and Some Applications. NATO Science Series, vol 91. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0143-4_20
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DOI: https://doi.org/10.1007/978-94-010-0143-4_20
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-1169-6
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