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High-Resolution Temperature-Jump Measurements Using Cooling-Correction

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Techniques and Applications of Fast Reactions in Solution

Part of the book series: NATO Advanced Study Institutes Series ((ASIC,volume 50))

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Abstract

Cooling of the sample after a temperature-jump results in a methodic error of the temperature-jump method in the ms- and sec-time range, especially when studying multiple relaxation phenomena and using micro or semi-micro sample cells. The cooling process has been studied both theoretically and experimentally using HV-conductivity heating and detection of optical absorption and fluorescence. An electronic signal correction circuit has been developed.

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References

  1. F.Kohlrausch, Praktische Physik, Vol.3, 22.ed. Stuttgart 1968

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  2. H.S.Carslaw and J.C.Jaeger, Conduction of Heat in Solids, 2.ed., Clarendon Press, Oxford 1973

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  3. C.R.Rabl, Lecture at 1.Meeting on “Fast Reactions in Solution” Cranfield/U.K. September 1977

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  4. R.Rigler, C.R.Rabl, and T.Jovin, Rev.Sci.Instr. 45 (1974), 580

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  5. E.Neumann and H.W.Chang, Proc.Nat.Acad.Sci.USA 73 (1976), 3994

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© 1979 D. Reidel Publishing Company

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Rabl, CR. (1979). High-Resolution Temperature-Jump Measurements Using Cooling-Correction. In: Gettins, W.J., Wyn-Jones, E. (eds) Techniques and Applications of Fast Reactions in Solution. NATO Advanced Study Institutes Series, vol 50. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-9490-4_10

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  • DOI: https://doi.org/10.1007/978-94-009-9490-4_10

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-009-9492-8

  • Online ISBN: 978-94-009-9490-4

  • eBook Packages: Springer Book Archive

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