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X-Ray Emission Spectroscopy

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Emission and Scattering Techniques

Part of the book series: NATO Advanced Study Institutes Series ((ASIC,volume 73))

Abstract

This paper reviews the applicability of x-ray emission spec-troscopy as a tool for studying the electronic structure of molecules and solids. The wavelengths of interest cover the range from about 1 Å (12 000 eV) up to 600 Å (20 eV). After a general introduction the basic principles of the spectrometers used in x-ray spectroscopy are described. In a theoretical section the relationship between the observed spectra and the electronic structure are then treated in the framework of the one-electron model. Examples of line emission spectra and band emission spectra are discussed and compared with theoretical predictions.

The last section reports recent developments in the field of anisotropic x-ray emission of single crystals. The investigation of this effect provides additional information about electronic structure and permits the identification and separation of π and σ orbitals or bands. This will be demonstrated by several examples.

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Authors and Affiliations

  1. Sektion Physik der Universität München, 8 München 22, Germany

    G. Wiech

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  1. G. Wiech
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Editors and Affiliations

  1. Inorganic Chemistry Laboratory, Oxford University, England

    Peter Day

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© 1981 D. Reidel Publishing Company

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Wiech, G. (1981). X-Ray Emission Spectroscopy. In: Day, P. (eds) Emission and Scattering Techniques. NATO Advanced Study Institutes Series, vol 73. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-8525-4_5

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  • DOI: https://doi.org/10.1007/978-94-009-8525-4_5

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-009-8527-8

  • Online ISBN: 978-94-009-8525-4

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