Skip to main content

Part of the book series: NATO Advanced Study Institutes Series ((NSSE,volume 55))

  • 133 Accesses

Abstract

Today, almost all linear electronic functions have been integrated using most of the technology and circuits available. Up to now the semiconductor manufacturer has always been willing to respond to customer demands and realize any given function with specific characteristics. This has resulted in the large number of integrated circuits presently available.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. B. Murari, ‘Power Integrated Circuit: Problems, Trade-offs and Solutions’, IEEE J. Solid State Circuits SC-13, 3 (1978).

    Google Scholar 

  2. P. Antognetti, G. R. Bisio, F. Curatelli and S. Palara, ‘Three Dimensional Transient Thermal Simulation: Application to Delayed Short Circuit Protection in Power IC’s’, IEEE J. Solid State Circuits SC-15, 3 (1980).

    Google Scholar 

  3. R. C. Dobkiri, ‘5A Regulator with Thermal Gradient Controlled Current Limit’, IEEE Inter. Solid State Circuits Conf. (1979).

    Google Scholar 

  4. V. Prestileo, ‘High Voltage Technology for Display Drivers’, in Electronic Inform. Display 2nd Course, Inter. School of Physic for Industry, presented at Erice, Italy, June (1977).

    Google Scholar 

  5. P. Selini and G. Vignola, ‘Reliability Improvement Through Design as Applied to a Family of Monolithic Lin. Operat. Amplif.’ , Congresso Varna Bulgaria, Sept. (1977).

    Google Scholar 

  6. F. Oettinger, D. Blackburn and S. Rubin, ‘Thermal Characterization of Power Transistors’, IEEE Trans. Electron Devices ED-23, 8 (1976).

    Google Scholar 

  7. D. Bowler and F. Lindholm, ‘High Current in Transistor Collector Regions’, IEEE Trans. Electron Devices ED-20, 3 (1973).

    Google Scholar 

  8. M. Felici, ‘Rottura Secondaria (Second Breakdown) nei Transistori di Potenza’ AEI Milano Giugno (1980).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1982 Martinus Nijhoff Publishers, The Hague

About this paper

Cite this paper

Bertotti, F., Murari, B. (1982). Bipolar Linear Integrated Circuits. In: Esaki, L., Soncini, G. (eds) Large Scale Integrated Circuits Technology: State of the Art and Prospects. NATO Advanced Study Institutes Series, vol 55. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-7645-0_12

Download citation

  • DOI: https://doi.org/10.1007/978-94-009-7645-0_12

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-009-7647-4

  • Online ISBN: 978-94-009-7645-0

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics