Abstract
Moire interferometry extends the applications of conventional moire into a realm of higher sensitivity. It has been quite extensively used for in-plane displacement measurement and an excellent review of some of this work is given in ref. 1. In these applications, a high frequency (600 ℓ /mm or 1200ℓ /mm) phase grating is replicated on the specimen via a thin layer of epoxy. This is then interrogated with an optically generated reference grating of twice the frequency to reveal the in-plane isothetics with a sensitivity of 0.83 µ/fringe or 0.417 µ/fringe. The use of an optically generated reference grating facilitates the creation of mismatch fringes, which enables optical differentiation of two patterns to remove any initial pattern or for strain determination.
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References
Post D: Developments in Moire Interferometry. Optical Engineering, 21 (3), p. 458 (1982).
Asundi A and MT Cheung: Moire Interferometry for Out-of-Plane Displacement Measurement. Journal of Strain Analysis (to be published).
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© 1986 Martinus Nijhoff Publishers, Dordrecht
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Asundi, A., Cheung, M.T. (1986). Vibration Analysis Using Moire Interferometry. In: Wieringa, H. (eds) Experimental Stress Analysis. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-4416-9_34
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DOI: https://doi.org/10.1007/978-94-009-4416-9_34
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-8465-9
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