Abstract
The lecture outlines the methods that have been used to record Xray diffraction data for structure determination for very small crystals; at Daresbury Laboratorys these employ either monochromatised synchrotron radiation and oscillation photographs or an area detector system, or the full white beam and Laue photographs; at other laboratories diffractometers have been used. The geometry of the Laue method and the procedure for deriving reflection intensities are described. Useful results have been obtained for crystals with dimensions in the range 10 – 30µm. The scattering power of crystals is compared, taking into account both volume and composition. Many very small crystals are found to have a high mosaic spread or similar disorder and this results in additional difficulties. One structure, of a layer silicate, has been determined from area detector measurements and one, of an organometallic, from Laue photographs.
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© 1988 D. Reidel Publishing Company
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Harding, M.M. (1988). The Use of Synchrotron Radiation for Laue Diffraction and for the Study of Very Small Crystals. In: Carrondo, M.A., Jeffrey, G.A. (eds) Chemical Crystallography with Pulsed Neutrons and Synchroton X-rays. NATO ASI Series, vol 221. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-4027-7_25
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DOI: https://doi.org/10.1007/978-94-009-4027-7_25
Publisher Name: Springer, Dordrecht
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