Abstract
Speckle on the image plane of a four-wave mixing imaging system may represent an important source of noise. In most of the practical applications the signal/speckle-noise ratio (SNR) has to be increased by some kind of speckle reduction technique. (1,2)
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References
J.P. Huignard, J.P. Herriau, L. Pichon and A. Marrakchi, Opt. Lett. 5, 436 (1980).
M.D. Levenson, J. Appl. Phys. 54, 4305 (1983)
J.P. Herriau, J.P. Huignard and P. Aubourg, Appl. Opt. 17, 1851 (1978)
W. Martienssen and S. Spiller, Phys. Lett. A 24, 126 (1967)
L.M. Bernardo and S.P. Almeida, Appl. Opt. 22, 3926 (1983)
S.I. Stepanov, V.V. Kulinov, M.P. Petrov, Opt. Comm. 44, 19 (1982)
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© 1987 Martinus Nijhoff Publishers, Dordrecht
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Bernardo, L.M., Soares, O.D.D. (1987). Speckle Reduction in Four-Wave Mixing Imaging with A Bi12 Si O20 Crystal. In: Soares, O.D.D. (eds) Optical Metrology. NATO ASI Series, vol 131. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-3609-6_39
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DOI: https://doi.org/10.1007/978-94-009-3609-6_39
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-8115-3
Online ISBN: 978-94-009-3609-6
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