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Speckle Reduction in Four-Wave Mixing Imaging with A Bi12 Si O20 Crystal

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Part of the book series: NATO ASI Series ((NSSE,volume 131))

Abstract

Speckle on the image plane of a four-wave mixing imaging system may represent an important source of noise. In most of the practical applications the signal/speckle-noise ratio (SNR) has to be increased by some kind of speckle reduction technique. (1,2)

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References

  1. J.P. Huignard, J.P. Herriau, L. Pichon and A. Marrakchi, Opt. Lett. 5, 436 (1980).

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© 1987 Martinus Nijhoff Publishers, Dordrecht

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Bernardo, L.M., Soares, O.D.D. (1987). Speckle Reduction in Four-Wave Mixing Imaging with A Bi12 Si O20 Crystal. In: Soares, O.D.D. (eds) Optical Metrology. NATO ASI Series, vol 131. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-3609-6_39

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  • DOI: https://doi.org/10.1007/978-94-009-3609-6_39

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-8115-3

  • Online ISBN: 978-94-009-3609-6

  • eBook Packages: Springer Book Archive

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