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Models Used in Undersea Fibre Optic Systems Reliability Prediction

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Semiconductor Device Reliability

Part of the book series: NATO ASI Series ((NSSE,volume 175))

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Abstract

This paper describes some of the Models used for component and system reliability prediction in the context of undersea optoelectronic regenerator modules. Practical results of the application of these models are presented in conjunction with a discussion of their limitations and ongoing developments.

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References

  1. Murphy, R.H., ‘Reliability — Growth Programmes for Undersea Communications Systems’. IEEE Tans. Reliability, Vol R-32, No. 3, August 1983.

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  4. Reynolds, F.H. ‘Accelerated — Test Procedures for Semiconductor Components’. 15th Annual Proceedings, Reliability Physics, 1977.

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  5. Murphy, R.H. ‘The Application of Degradation Models to Laser Diode Wear-out Life Prediction’, 9th E.C.O.C, October 1983.

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  6. Janssen, A.P. et al. ‘High Reliability Lasers for Submarine Use’. Proc. Suboptic ’86 Conf. February 1986.

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  7. Pullem, G.G. et al ‘Reliability Analysis of a Multi path Switching Network’. Microelectronics and Reliability, Vol.28, No.4, 1988.

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© 1990 Kluwer Academic Publishers

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Murphy, R.H. (1990). Models Used in Undersea Fibre Optic Systems Reliability Prediction. In: Christou, A., Unger, B.A. (eds) Semiconductor Device Reliability. NATO ASI Series, vol 175. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-2482-6_9

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  • DOI: https://doi.org/10.1007/978-94-009-2482-6_9

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-7620-3

  • Online ISBN: 978-94-009-2482-6

  • eBook Packages: Springer Book Archive

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