Abstract
After reiterating the reliability objectives of such equipment in a special link such as EMOS and the respective allowances made for transmit and receive components, and a overview of the consolidated reliability data obtained on these components, the emphasis will be put on the resulting selection procedures that have been chosen after an optimisation and validation phase. The practical application of these procedures in supplies for the EMOS link shall be described in particular detail.
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© 1990 Kluwer Academic Publishers
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Gueguen, M., Boussois, J.L., Goudard, J.L., Sauvage, D. (1990). Screening and burn-in: application to optoelectronic device selection for high-reliability S 280 optical submarine repeaters. In: Christou, A., Unger, B.A. (eds) Semiconductor Device Reliability. NATO ASI Series, vol 175. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-2482-6_3
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DOI: https://doi.org/10.1007/978-94-009-2482-6_3
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-7620-3
Online ISBN: 978-94-009-2482-6
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