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Semiconductor Device Reliability pp 43–73Cite as

Screening and burn-in: application to optoelectronic device selection for high-reliability S 280 optical submarine repeaters

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Part of the book series: NATO ASI Series ((NSSE,volume 175))

Abstract

After reiterating the reliability objectives of such equipment in a special link such as EMOS and the respective allowances made for transmit and receive components, and a overview of the consolidated reliability data obtained on these components, the emphasis will be put on the resulting selection procedures that have been chosen after an optimisation and validation phase. The practical application of these procedures in supplies for the EMOS link shall be described in particular detail.

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Bibliography

  1. Bzrozowski H., Lemonde J. L., Fourrier J. Y., Giron P., (18–21 February 1986), ‘International Conference on Optical Fiber Submarine Telecommunication Systems’, Suboptic 1986, Paris, 199–205.

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  2. Pestie J. P., Franco P., Gobin F., Durand P., ‘International Conference on Optical Fiber Submarine Telecommunication Systems’, Suboptic 1986, Paris, 173–180.

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  3. Pestie J. P., ’Reliability assessments and selection procedures of semiconductor components for EMOS 1 link’, EMOS contract, 1987.

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  4. ‘Fiabilité des photodétecteurs PIN InGaAs/InP planar pour liaisons sous-marines sur fibre optique’, Cinquième colloque international de fiabilité et de maintenabilité, Biarritz, 1986.

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Author information

Authors and Affiliations

  1. Alcatel CIT, Centre de Villarceaux, Route de Villejust-Nozay, BP 6, 91620, La Ville-Du-Bois, France

    M. Gueguen, J. L. Boussois, J. L. Goudard & D. Sauvage

Authors
  1. M. Gueguen
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  2. J. L. Boussois
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  3. J. L. Goudard
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  4. D. Sauvage
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Editor information

Editors and Affiliations

  1. Surface Physics Branch, Naval Research Laboratory, Washington, D.C., USA

    A. Christou

  2. Bell Communications Research, Red Bank, NJ, USA

    B. A. Unger

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© 1990 Kluwer Academic Publishers

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Gueguen, M., Boussois, J.L., Goudard, J.L., Sauvage, D. (1990). Screening and burn-in: application to optoelectronic device selection for high-reliability S 280 optical submarine repeaters. In: Christou, A., Unger, B.A. (eds) Semiconductor Device Reliability. NATO ASI Series, vol 175. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-2482-6_3

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  • DOI: https://doi.org/10.1007/978-94-009-2482-6_3

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-7620-3

  • Online ISBN: 978-94-009-2482-6

  • eBook Packages: Springer Book Archive

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