Skip to main content

Considerations on the Degradation of DFB Lasers

  • Chapter
Book cover Semiconductor Device Reliability

Part of the book series: NATO ASI Series ((NSSE,volume 175))

Abstract

Reliability of recently developed 1.3 µm and 1.55 µm high power DFB lasers is investigated from the viewpoint of wear-out failure and random failure modes. The change in spectral characteristics during operation and the electric surge endurance level is also presented.

The failure modes are similar to those of FP lasers. The degradation speed mainly depends on the injected current density and is affected by BH interface degradation. The median lifetime at 50°C is estimated to be greater than 105 hours for laser output powers of around 15 mW for 1.3 µm lasers and around 10 mW for 1.55 µm lasers. The random failure rate is also estimated to be less than 200 FITs. In addition, there is no difference between the endurance level against electric surge of DFB and FP lasers and of lasing wavelengths of 1.3 µm and 1.55 µm. These results show that DFB lasers could operate at laser output powers of 10 mW even in practical optical transmission systems.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 259.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 329.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 329.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Nakano, Y., Motosugi, G., Yoshikuni, Y., and Ikegami, T. (1983) ‘Aging characteristics of InGaAsP/InP DFB lasers’, Electron Lett. 19, 437–438.

    Article  Google Scholar 

  2. Fukuda, M. Suzuki, M., Motosugi, G., Ikegami, T., and Yoshida, J. (1988) ‘Degradation behaviors of buried heterostructure InGaAsP/InP distributed feedback lasers grown by liquid-phase epitaxy’, J. Appl. Phys. 64, 496–499.

    Article  Google Scholar 

  3. Wakabayashi, H., Akiba, S., Matsushita, Y., and Yamamoto, S. (1988) ‘Reliability of A/4-shifted DFB lasers fabricated on a mass-production basis’, Electron. Lett. 24, 1175–1176.

    Article  Google Scholar 

  4. Goodwin, A. R., Davis, I. G. A., Anslow, P. J., and Rashid, A. (1988) ‘Reliability of DFB ridge waveguide lasers emitting at 1.55 µm in normal and overstress conditions’, Conf. on Lasers and Electro-Optics (Anaheim, California), THM 50.

    Google Scholar 

  5. Shima, K., Yonetani, H., Kohno, K., Morimoto, M., Ushijima, I., Takada, T., and Shibata, T. (1988) ‘High power 1.5-µm DFB laser diode for long haul optical transmission systems’, 14th Europian Conf. Optical Comm. (Brighton, U.K.), 345–348.

    Google Scholar 

  6. Mizuishi, K., Sawai, M., Todoroki, S., Tsuji, S., Hirao, M., and Nakamura, M. (1983) ‘Reliability of InGaAsP/InP buried heterostructure 1.3 µm lasers’ IEEE J. Quantum Electron., QE-19, 1294–1301.

    Google Scholar 

  7. Fukuda, M. and Iwane, G. (1985) ‘Degradation of active region in InGaAsP/lnP buried heterostructure lasers’, J. Appl. Phys. 58, 2932–2936.

    Article  Google Scholar 

  8. Fukuda, M., Noguchi, Y., Motosugi, G., Nakano, Y., Tsuzuki, N., and Fujita, O. (1987) ‘Suppression of interface degradation in InGaAsP/lnP buried heterostructure lasers’, IEEE J. Lightwave Tech. LT-5, 1778–1781.

    Google Scholar 

  9. Yasaka, H., Fukuda, M., and Ikegami, T. (1988) ‘Current tailoring for lowering linewidth floor’, Electron Lett. 24, 760–762.

    Article  Google Scholar 

  10. Ishikawa, H., Sugano, M., and Imai, H. (1987) ‘Reliability of DFB laser against surge current’, 13th European Conf. Optical Comm. (Helsinki, Finland), 81–84.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1990 Kluwer Academic Publishers

About this chapter

Cite this chapter

Ikegami, T., Fukuda, M., Suzuki, M. (1990). Considerations on the Degradation of DFB Lasers. In: Christou, A., Unger, B.A. (eds) Semiconductor Device Reliability. NATO ASI Series, vol 175. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-2482-6_17

Download citation

  • DOI: https://doi.org/10.1007/978-94-009-2482-6_17

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-7620-3

  • Online ISBN: 978-94-009-2482-6

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics