Abstract
The residual stress in physical vapour deposited (PVD) titanium nitride coatings has been measured by X-ray diffraction using the sin Ψ technique. The linear biaxial approximation of εΨΨ with sin2 Ψ may result in appreciable errors in the principal stresses if curvature or splitting are present in the data. Results are presented comparing this simple approach with a more detailed analysis which assumes an exponential variation of stress with coating thickness. The combination of several X-ray diffraction techniques and other analytical methods has enabled a structure model to be suggested for these physical vapour deposited coatings and measured stresses can be related to coating process variables.
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© 1989 United Kingdom Atomic Energy Authority
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Jones, A.M., Rickerby, D.S., Bellamy, B.A. (1989). Modelling of Complex Stress Systems and the Provision of a Unified Structure Model for Titanium Nitride Coatings. In: Beck, G., Denis, S., Simon, A. (eds) International Conference on Residual Stresses. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1143-7_52
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DOI: https://doi.org/10.1007/978-94-009-1143-7_52
Publisher Name: Springer, Dordrecht
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