Abstract
Recent hardware developments of automated, high speed, portable X-ray diffraction stress analysis instrumentation have not yet resulted in widespread use of the technique in industry despite its potentials. We suggest that these hardware developments require an equivalent development in the training of instrument operators in order to guarantee the integrity of the resulting data, as well as to enhance the understanding of such materials characterization data. The hurdle to date is the variety of skills necessary in a wide range of scientific and engineering disciplines and which are not commonly found in a single individual. It is proposed that a computer-based system, integrating knowledge bases, visualization and analysis tools and which is focused on human performance can provide an efficient solution to this problem.
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© 1989 Elsevier Science Publishers Ltd
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Dehan, C.F., Hendricks, R.W., Roach, J.W. (1989). An Intelligent Workstation for Stress Determination Using X-Ray Diffraction. In: Beck, G., Denis, S., Simon, A. (eds) International Conference on Residual Stresses. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1143-7_4
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DOI: https://doi.org/10.1007/978-94-009-1143-7_4
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-7007-2
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