Abstract
A method is presented to calculate the X-ray elastic constants from the orientation distribution function (O.D.F.) describing the texture of the material. The method is based on the Reuss and the Voigt theories, and on a mixed model. A surface effect is discussed. It is suggested, that near the surface, the elastic strains of the crystals are less constrained, which affects the model to be used for the analysis of X-ray data.
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References
Reuss, A., Z. Ana. Math, und Mech.. 1929,9,49–51.
Bunge, H.J., Texture Analys in Material Science. Butterworths, London, 1982.
Brakman, C.M., A general treatment of X-ray residual macrostress determination in textured cubic materials, Cryst. Res. Technol.. 1985,20,593–618.
Barral, M., Lebrun, J.L., Sprauel, J.M. and Maeder, G., Elastic and plastic anisotropy in plastically formed steel sheets. Consequences for the X-ray stress measurement, Proc. ICOTOM 7. Netherlands Society for Materials Science, 1984,555-560.
Voigt, W., Lehrbuch der KristallPhysik. Teubner, Berlin, 1928,962–967.
Serruys, W., Röntaenoqrafisch meten van restspanningen in getextureerd materiaal. Ph. D. Thesis, Department of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, Belgium, 1988.
Chung, D.H. and Buessem, W.R., The elastic anisotropy of crystals, J. Appl. Phys.. 1967,38, 2010–2012.
Chung, D.H. and Buessem, W.R., The Voigt-Reuss-Hill approximation and elastic moduli of polycrystalline MgO, CaF2, b-ZnS, ZnSe and CdTe., J. Appl. Phys.. 1967,38,2535–2540.
Kröner, E., Z. Phvsik. 1958,151,504.
Möller, H. and Martin, G., Elastische Anisotropic und röntgenografische Spannungsmessung, Mitt. K. Wilh. Inst. Eisertforsch.. 1939,21,261–269.
Hauk, V. and Macherauch, E., Eigenspannungen und Lastspannunpen: 1.1 Die zweckmassioe Durchführuna röntaenoorafischer Spannunosermittlungen. HTM-Beiheft, Carl Hanser Verlag, München, 1982,1-19
Serruys W., Van Houtte P. and Aernoudt E., X-ray measurement of residual stresses in textured materials with the aid of orientation distribution functions, in Residual Stresses in Science and Technology (Proc. ICRS 1. Garmisch-Partenkirchen 1986) . vol. 1. E. Macherauch and V. Hauk, eds., DGM Informationsgesellschaft Verlag, Oberursel, FRG, 1987,417–424.
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© 1989 Elsevier Science Publishers Ltd
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Serruys, W., Langouche, F., Van Houtte, P., Aernoudt, E. (1989). Calculation of X-Ray Elastic Constants in Isotropic and Textured Materials. In: Beck, G., Denis, S., Simon, A. (eds) International Conference on Residual Stresses. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1143-7_26
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DOI: https://doi.org/10.1007/978-94-009-1143-7_26
Publisher Name: Springer, Dordrecht
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