Abstract
Deviation of the sample surface from the surface of the focusing circle can lead to significant errors in the resulting stress as determined by x-ray diffraction. In this paper, these errors are computed as a function of the radius of curvature of the sample and the divergence of the incident beam for both positive and negative ψ tilt angles.
Research initiated while R. W. Hendricks was with Technology for Energy Corporation, Knoxville, TN 37932 under the sponsorship of the Department of the Navy, Naval Air Systems Command, through contract number N 00019-85-C-0419
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References
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© 1989 Elsevier Science Publishers Ltd
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Hendricks, R.W., Jo, J. (1989). The Effects of Displacement of the Sample Surface from the Focusing Circle on Errors in Residual Stress Determination by X-Ray Diffraction1 . In: Beck, G., Denis, S., Simon, A. (eds) International Conference on Residual Stresses. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1143-7_21
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DOI: https://doi.org/10.1007/978-94-009-1143-7_21
Publisher Name: Springer, Dordrecht
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