Abstract
The error in measurement of 2θ when a linear position sensitive proportional counter (PSPC) is not positioned on the focussing circle is investigated. The errors depend both on 2θ and on the ψ tilt used for X-ray residual stress measurement. A simple calculation predicts that the errors are larger for smaller Bragg angles and for negative ψ tilts. A comparison of data from common engineering materials with diffraction peaks between 127° and 156° validated the predicted trends. These results show that errors in peak location for negative ψ tilts, commonly used in the analysis of triaxial stress states, can be very large for 2θ less that 145°.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Zantopulos, H. and Jatczak, C., Systematic Errors in X-Ray Dif fractometer Stress Measurements Due to Specimen Geometry and Beam Divergence, Advances in X-Ray Analysis, 14, 360–371, 1970.
James, M.R. and Cohen, J.B., Geometrical Problems with a Position Sensitive Detector Employed on a Dif fractometer, J. Appl. Cryst., 12, 339–445, 1979.
Dolle, H., The Influence of Multiaxial Stress States, Stress Gradients and Elastic Anisotropy on the Evaluation of Residual Stresses by X-Rays, J. Appl. Cryst., 1979, 12, 489.
Noyan, I.C. and Cohen, J.B., Residual Stress - Measurement by Diffraction and Interpretation, Springer-Verlag, 1987.
Hendricks, R.W. and Jo, J., “Errors in X-Ray Residual Stress Measurement,” ICRS-II, Nancy, France, Nov. 23-25, 1988.
Pardue, E.B.S., James, M.R. and Hendricks, R.W., Focusing Circle Errors in X-Ray Residual Stress Measurements of Nickel-Based Materials, Advances in X-Ray Analysis, 31, 205–212, 1988.
James, M.R. and Cohen, J.B., The Measurement of Residual Stresses by X-Ray Diffraction Techniques, in Treatise on Materials Science and Technology, 19A, (Ed. H. Herman) Academic Press, 1-62, 1980.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1989 Elsevier Science Publishers Ltd
About this chapter
Cite this chapter
James, M.R., Pardue, E.B.S. (1989). X-Ray Diffraction Focusing Circle Errors for a PSPC Based System. In: Beck, G., Denis, S., Simon, A. (eds) International Conference on Residual Stresses. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1143-7_17
Download citation
DOI: https://doi.org/10.1007/978-94-009-1143-7_17
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-7007-2
Online ISBN: 978-94-009-1143-7
eBook Packages: Springer Book Archive