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X-Ray Diffraction Focusing Circle Errors for a PSPC Based System

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Abstract

The error in measurement of 2θ when a linear position sensitive proportional counter (PSPC) is not positioned on the focussing circle is investigated. The errors depend both on 2θ and on the ψ tilt used for X-ray residual stress measurement. A simple calculation predicts that the errors are larger for smaller Bragg angles and for negative ψ tilts. A comparison of data from common engineering materials with diffraction peaks between 127° and 156° validated the predicted trends. These results show that errors in peak location for negative ψ tilts, commonly used in the analysis of triaxial stress states, can be very large for 2θ less that 145°.

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References

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© 1989 Elsevier Science Publishers Ltd

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James, M.R., Pardue, E.B.S. (1989). X-Ray Diffraction Focusing Circle Errors for a PSPC Based System. In: Beck, G., Denis, S., Simon, A. (eds) International Conference on Residual Stresses. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1143-7_17

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  • DOI: https://doi.org/10.1007/978-94-009-1143-7_17

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-7007-2

  • Online ISBN: 978-94-009-1143-7

  • eBook Packages: Springer Book Archive

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