Skip to main content
SpringerLink
Log in
Book cover

Transactions of the Materials Research Society of Japan pp 12–43Cite as

Development of the Electron Microscope in Japan

  • Chapter

  • 151 Accesses

Abstract

This article is about how Japan has attained today’s top position in electron microscope manufacturing. My observation is that it is simply because of

  1. (1)

    cooperative, and at the same time, competitive, alliances among universities and industries for R&D, and

  2. (2)

    from industry’s side, continuous and determined efforts to reach the theoretical limit, disregarding the short term efficiency.

This is a preview of subscription content, log in via an institution.

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Reference

  1. B. v. Borries, E. Ruska: Wiss. Veroff. Siemens-Werk., “Vorlanfige Mitteilungen uber Fortschritte im Bau und in der Leistungen des Ubermikroskopes”, 17–1, 99 (1938).

    Google Scholar 

  2. B. v. Borries : The physical situation and the performance of high-resolving microscopy using fast corpuscles. Proc. International Conf. of Electron Microscope, ( London ) 1954, 4–25

    Google Scholar 

  3. J. W. Menter: The direct study by electron microscopy of crystal lattices and their imperfections: Proc. Roy. Soc. A 236, 119–135 (1956)

    Article  CAS  Google Scholar 

  4. N. Uyeda, T. Kobayashi, E. Suito, Y. Harada and M. Watanabe: Direct observation of phthalocyanine molecules in epitaxial films. Proc. International Conf. of Electron Microscopy Grenoble (1970) Vol. 1, 23–24

    Google Scholar 

  5. K. Ito, T. Ito and M. Watanabe: An improved reflection type electron microscope. J. Electron microscopy Japan, 2, 10–14 (1954)

    Google Scholar 

  6. K. Yagi: Observation of surface with ultra clean vacuum electron microscope (in Japanese): Electron microscopy, 16, 128–135 (1981)

    CAS  Google Scholar 

  7. N. Takahashi and K. Mihama: Etude par microdiffraction et microscopie electroniques et la transformation des alliages Al-Cu due au chauffage dans le vide. Acta Metallurgica, Vol. 5, March, 159–168, (1957)

    Article  CAS  Google Scholar 

  8. H. Koike and K. Uyeno: Electron microscope: Japanese Patent 983332 applied on April 18, 1970.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. JEOL Co. Ltd., 3-2-1, Musashino, Akishima, Tokyo, Japan

    Kazuo Ito

Authors
  1. Kazuo Ito
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Shigeyuki Sōmiya Masao Doyama Masaki Hasegawa Yoshitaka Agata

Rights and permissions

Reprints and permissions

Copyright information

© 1990 Elsevier Science Publishers Ltd.

About this chapter

Cite this chapter

Ito, K. (1990). Development of the Electron Microscope in Japan. In: Sōmiya, S., Doyama, M., Hasegawa, M., Agata, Y. (eds) Transactions of the Materials Research Society of Japan. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-0789-8_2

Download citation

  • DOI: https://doi.org/10.1007/978-94-009-0789-8_2

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-6842-0

  • Online ISBN: 978-94-009-0789-8

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics

Search

Navigation