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Critical Issues on the Strong Coupling Régime In Semiconductor Microcavities.

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Microcavities and Photonic Bandgaps: Physics and Applications

Part of the book series: NATO ASI Series ((NSSE,volume 324))

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Abstract

A general introduction on the strong coupling regime (SCR) has been made in previous and more generals paper in this book, the reader should refer to e.g. the text from Y. Yamamoto [1] or R.P. Stanley [2]. In this paper we want to address two critical issues on the SCR. Both are still controversial, experimentally and theoretically. These points are i) the non-linear behavior of the SCR and ii) the effect of inhomogeneous broadening. The future use of the SCR for optoelectronic devices will depends on the final understanding of these questions

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© 1996 Kluwer Academic Publishers

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Houdré, R., Stanley, R.P., Oesterle, U., Pellandini, P., Ilegems, M. (1996). Critical Issues on the Strong Coupling Régime In Semiconductor Microcavities.. In: Rarity, J., Weisbuch, C. (eds) Microcavities and Photonic Bandgaps: Physics and Applications. NATO ASI Series, vol 324. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-0313-5_3

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  • DOI: https://doi.org/10.1007/978-94-009-0313-5_3

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-6626-6

  • Online ISBN: 978-94-009-0313-5

  • eBook Packages: Springer Book Archive

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