Abstract
Important performance factors and basic device physics of organic or inorganic-channel thin-film transistors (TFTs) are addressed before introducing the photo-excited charge collection spectroscopy (PECCS), so that systematic and in-depth understanding on the device stability issues may be naturally drawn in focus. Device architecture, device physics, and general stability issues in TFT (or field-effect transistor) are thus introduced in the initial sections, and in the last section our photon-probing technique is explained along with its own device physics.
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Im, S., Chang, YG., Kim, J. (2013). Device Stability and Photo-Excited Charge-Collection Spectroscopy. In: Photo-Excited Charge Collection Spectroscopy. SpringerBriefs in Physics. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-6392-0_1
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DOI: https://doi.org/10.1007/978-94-007-6392-0_1
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