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Fundamentals of Reliability for Flash Memories

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Flash Memories

Part of the book series: Springer Series in Advanced Microelectronics ((MICROELECTR.,volume 40))

Abstract

The focus of this chapter is the link between reliability specification parameter and the flash behaviour over lifetime.

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References

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Authors and Affiliations

  1. Institute of Technical Electronics, Technical University of Munich (TUM), Schleienweg 1a, 81825, München, Germany

    Detlev Richter

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  1. Detlev Richter
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Correspondence to Detlev Richter .

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© 2014 Springer Science+Business Media Dordrecht

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Richter, D. (2014). Fundamentals of Reliability for Flash Memories. In: Flash Memories. Springer Series in Advanced Microelectronics, vol 40. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-6082-0_4

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  • DOI: https://doi.org/10.1007/978-94-007-6082-0_4

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  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-007-6081-3

  • Online ISBN: 978-94-007-6082-0

  • eBook Packages: EngineeringEngineering (R0)

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