Abstract
During the years several methods have been developed to identify and quantify the phases in our samples. The newly developed methods respond to precise needs like increasing accuracy, lowering detection limits, automatize and speed-up the process or overcome errors and limitations. Most of the last developments are based on the use of large set of data and full pattern analyses like the Rietveld method. The progresses have been stimulated by the need to analyze new and complex materials with the help of advanced hardware to collect quickly and reliably our data. Refinement of old and new methods will be presented for the quantification of phases as well as some examples. Particular cases will be treated for layered materials and thin films, bulk amorphous, textured samples and clay materials. The last frontier appears to be the combination of the diffraction with other techniques to improve the final analysis.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Lutterotti L, Scardi P, Tomasi A (1993) Application of the Rietveld method to phase analysis of multilayered systems. Mater Sci Forum 133–136:57–62
Simek D, Kuzel R, Rafaja D (2006) Reciprocal-space mapping for simultaneous determination of texture and stress in thin films. J Appl Crystallogr 39:487–501
Ferrari M, Lutterotti L (1994) Method for the simultaneous determination of anisotropic residual stresses and texture by X-ray diffraction. J Appl Phys 76(11):7246–7255
Cont L, Chateigner D, Lutterotti L, Ricote J, Calzada ML, Mendiola J (2002) Combined X-ray texture-structure-microstructure analysis applied to ferroelectric ultrastructures: a case study on Pb0. 76Ca0. 24TiO3. Ferroelectrics 267:323–328
Lutterotti L (2010) Total pattern fitting for the combined size-strain-stress-texture determination in thin film diffraction. Nuclear Inst Methods Phys Res B 268:334–340
Ufer K, Roth G, Kleeberg R, Stanjek H, Dohrmann R, Bergmann J (2004) Description of X-ray powder pattern of turbostratically disordered layer structures with a Rietveld compatible approach. Zeitschrift für Kristallographie 219:519–527
Ufer K, Kleeberg R, Bergmann J, Curtius H, Dohrmann R (2008) Refining real structure parameters of disordered layer structures within the Rietveld method. Zeitschrift für Kristallographie 27(Suppl):151–158
Lutterotti L, Voltolini M, Wenk HR, Bandyopadhyay K, Vanorio T (2010) Texture analysis of a turbostratically disordered Ca-montmorillonite. Am Miner 95:98–103
Brindley GW (1945) A theory of X-ray absorption in mixed powders. Philos Mag 36:347–369
Taylor JC, Matulis CE (1991) Absorption contrast effects in the quantitative XRD analysis of powders by full multiphase profile refinement. J Appl Crystallogr 24:14–17
Hill RJ, Howard CJ (1987) Quantitative phase analysis from neutron powder diffraction data using the Rietveld method. J Appl Crystallogr 20:467–474
Bish DL, Howard SA (1988) Quantitative phase analysis using the Rietveld method. J Appl Crystallogr 21:86–91
Elvati G, Lutterotti L (1998) Avoiding surface and absorption effects in XRD quantitative phase analysis. Mater Sci Forum 278–281:69–74
Le Bail A (1995) Modelling the silica glass structure by the Rietveld method. J Non-Cryst Solids 183(1–2):39–42
Lutterotti L, Ceccato R, Dal Maschio R, Pagani E (1998) Quantitative analysis of silicate glass in ceramic materials by the Rietveld method. Mater Sci Forum 278–281:87–92
Le Bail A (2000) Reverse Monte Carlo and Rietveld modeling of the NaPbM2F9 (M = Fe, V) fluoride glass structures. J Non-Cryst Solids 271:249–259
Lutterotti L, Campostrini R, Di Maggio R, Gialanella S (2000) Microstructural characterization of amorphous and nanocrystalline structures through diffraction methods. Mater Sci Forum 343–346:657–664
Lutterotti L, Bortolotti M, Magarotto L, Deflorian C, Petricci E (2005) Rietveld structural and microstructural characterization of pharmaceutical products using the program Maud. Presented at PPXRD-4, Barcelona, Spain
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2012 Springer Science+Business Media Dordrecht
About this paper
Cite this paper
Lutterotti, L. (2012). Quantitative Phase Analysis: Method Developments. In: Kolb, U., Shankland, K., Meshi, L., Avilov, A., David, W. (eds) Uniting Electron Crystallography and Powder Diffraction. NATO Science for Peace and Security Series B: Physics and Biophysics. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-5580-2_21
Download citation
DOI: https://doi.org/10.1007/978-94-007-5580-2_21
Published:
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-007-5579-6
Online ISBN: 978-94-007-5580-2
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)