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Laser Diode Beam Characterization

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Book cover Laser Diode Beam Basics, Manipulations and Characterizations

Part of the book series: SpringerBriefs in Physics ((SpringerBriefs in Physics))

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Abstract

Techniques for measuring single TE laser diode beam size, waist location, M 2 factor, far field divergence and astigmatism are described. Astigmatism measurement is used as an example to illustrate laser diode beam properties.

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Authors and Affiliations

  1. L-3 Communications, Integrated Optical System Division, Brashear Site, Epsilon Drive 615, Pittsburgh, PA, 15238, USA

    Haiyin Sun

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  1. Haiyin Sun
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© 2012 The Author(s)

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Sun, H. (2012). Laser Diode Beam Characterization. In: Laser Diode Beam Basics, Manipulations and Characterizations. SpringerBriefs in Physics. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-4664-0_5

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